Cisco ONS 15454 SDH Specifications download pdf (Page 327)

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Cisco ONS 15454 SDH Installation and Operations Guide, R3.3

May 2002

Chapter 8 SDH Performance Monitoring

SDH Performance Monitoring for Electrical Cards

Table 8-8 E3 Line PMs for the E3 Card, Near-End

Parameter Definition

CV-L

Code Violation Line (CV-L) indicates the number of coding violations

occurring on the line. This parameter is a count of bipolar violations

(BPVs) and excessive zeros (EXZs) occurring over the accumulation

period.

ES-L

Errored Seconds Line (ES-L) is a count of the seconds containing one or

more anomalies (BPV + EXZ) and/or defects (loss of signal) on the line.

SES-L

Severely Errored Seconds Line (SES-L) is a count of the seconds

containing more than a particular quantity of anomalies (BPV + EXZ >

44) and/or defects on the line.

LOSS-L

Line Loss of Signal (LOSS-L) is a count of one-second intervals

containing one or more LOS defects.

Table 8-9 E3 Path PMs for the E3 Card, Near-End

Parameter Definition

P-ES

Path Errored Second (P-ES) is a one second period with at least one

defect.

P-SES

Path Severely Errored Seconds (P-SES) is a one-second period containing

at least one defect. SES is a subset of ES.

P-UAS

Path Unavailable Seconds (P-UAS) is a count of the seconds when the

path was unavailable. A path becomes unavailable when ten consecutive

seconds occur that qualify as P-SESs, and it continues to be unavailable

until ten consecutive seconds occur that do not qualify as P-SESs.

P-ESR

Path Errored Second Ratio (P-ESR) is the ratio of errored seconds to total

seconds in available time during a fixed measurement interval.

P-SESR

Path Severely Errored Second Ratio (P-SESR) is the ratio of SES to total

seconds in available time during a fixed measurement interval.

Table 8-10 VC3 Low-Order Path PMs for the E3 Card, Near-End and Far-End

Parameter Definition

LP-EB

Low-Order Path Errored Block (LP-EB) indicates one or more bits are in

error within a block.

LP-BBE

Low-Order Path Background Block Error (LP-BBE) is an errored block

not occurring as part of a severely errored second (SES).

LP-ES

Low-Order Path Errored Second (LP-ES) is a one second period with one

or more errored blocks or at least one defect.

LP-SES

Low-Order Path Severely Errored Seconds (LP-SES) is a one-second

period containing >

30% errored blocks or at least one defect. SES is a

subset of ES.

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